Journals

  • Lorenzo Torto, Andrea Cester, Nicola Wrachien, Antonio Rizzo, Desta Gedefaw, Mats R. Andersson, Mirko Seri, Michele Muccini, "Application of an Open-Circuit Voltage Decay Model to Compare the Performances of Donor Polymers in Bulk Heterojunction Solar Cells", IEEE Journal of Photovoltaics, Vol. 8, n. 2, p. 517-524, March 2018, DOI:10.1109/JPHOTOV.2018.2792461

  • Antonio Rizzo, Andrea Cester, Morten V. Madsen, Frederik C. Krebs, Suren A. Gevorgyan, "A Novel Algorithm for Lifetime Extrapolation, Prediction, and Estimation of Emerging PV Technologies", Small methods, Vol. 2, n. 1, p. 1700285-1 - 1700285-9, 2015, DOI:10.1002/smtd.201700285

  • Nicolò Lago and Andrea Cester, "Flexible and Organic Neural Interfaces: A Review", Applied Sciences, Vol. 7, n. 12, p. 1292, 2017, DOI:10.3390/app7121292

  • L. Torto, A. Cester, A. Rizzo, N. Wrachien, S. A. Gevorgyan, M. Corazza, F. C. Krebs,
    "Model of organic solar cell photocurrent including the effect of charge accumulation at interfaces and non-uniform carrier generation",
    IEEE Journal of the Electron Devices Society, Vol. 4, n. 6, p. 387-395, 2016,
    DOI:10.1109/JEDS.2016.2602563

  • N. Lago, A. Cester, N. Wrachien, E. Benvenuti, S. D. Quiroga, M. Natali, S. Toffanin, M. Muccini, G. Meneghesso,
    "Investigation of Mobility Transient on Organic Transistor by Means of DLTS Technique",
    IEEE Transactions on Electron Devices, Vol. 63, n. 11, p. 4432-4439, 2015,
    DOI:10.1109/TED.2016.2611142

  • A. Rizzo, L. Torto, N. Wrachien, M. Corazza, F. C. Krebs, S. A. Gevorgyan, A. Cester,
    "Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress",
    IEEE Journal of Photovoltaics, Vol. 6, n. 6, p. 1542-1548, 2016,
    DOI:10.1109/JPHOTOV.2016.2603841

  • A. Rizzo, A. Cester, N. Wrachien, N. Lago, L. Torto, M. Barbato, J. Favaro, S. A. Gevorgyan, M. Corazza, F. C. Krebs,
    "Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination",
    Solar Energy Materials and Solar Cells, Vol. 157, p. 337–345, June 2016,
    DOI: 10.1016/j.solmat.2016.06.001

  • N. Lago, A. Cester, N. Wrachien, M. Natali, S. D. Quiroga, S. Bonetti, M. Barbato, A. Rizzo, E. Benvenuti, V. Benfenati, M. Muccini, S. Toffanin, G. Meneghesso,
    "A physical-based equivalent circuit model for an organic/electrolyte interface",
    Organic Electronics, Vol. 35, p. 176–185, August 2016,
    DOI: 10.1016/j.orgel.2016.05.018

  • N. Lago, A. Cester, N. Wrachien, I. Tomasino, S. Toffanin, S. D. Quiroga, E. Benvenuti, M. Natali, M. Muccini, and G. Meneghesso,
    "On the Pulsed and Transient Characterization of Organic Field-Effect Transistors",
    IEEE - Electron Device Letters, Vol.36 , n.12 , p.1359-1362, Dec. 2015,
    DOI: 10.1109/LED.2015.2496336

  • N. Wrachien, N. Lago, A. Rizzo, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini, G. Meneghesso, A. Cester,
    "Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics",
    Microelectronics Reliability, Vol. 55, n. 9-10, p. 1790-1794, 2015,
    DOI:10.1016/j.microrel.2015.06.073

  • A. Cester, A. Rizzo, A. Bazzega, N. Lago, J. Favaro, M. Barbato, N. Wrachien, S.A. Gevorgyan, M. Corazza, F.C. Krebs,
    "Effects of constant voltage and constant current stress in PCBM: P3HT solar cells",
    Microelectronics Reliability, Vol. 55, n. 9-10, p. 1795-1799, 2015,
    DOI:10.1016/j.microrel.2015.06.082

  • N. Wrachien, A. Cester, N. Lago, A. Rizzo, R. D’Alpaos, A. Stefani, G. Turatti, M. Muccini, G. Meneghesso,
    "Reliability study of organic complementary logic inverters using constant voltage stress",
    Solid-State Electronics, Vol. 113, n. 11, p. 151-156, Nov. 2015,
    DOI:10.1016/j.sse.2015.05.028

  • M. V. Madsen, S. A. Gevorgyan, R. Pacios, J. Ajuria, I. Etxebarria, J. Kettle, N. D. Bristow, M. Neophytou, S. A. Choulis, L. S. Roman, T.Yohannes, A. Cester, et al.,
    "Worldwide outdoor round robin study of organic photovoltaic devices and modules",
    Solar Energy Materials and Solar Cells, Vol. 130, p. 281-290, Nov. 2014,
    DOI:10.1016/j.solmat.2014.07.021

  • N. Wrachien, A. Cester, N. Lago, G. Meneghesso, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini
    "Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states",
    Microelectronics Reliability, Vol. 54, n. 9, p. 1638-1642, Sept. 2014,
    DOI:10.1016/j.microrel.2014.07.065

  • N. Wrachien, A. Cester, D. Bari, R. Capelli, R. D'Alpaos, M. Muccini, A. Stefani, G. Turatti, G. Meneghesso
    "Effects of Constant Voltage Stress on p- and n-type Organic Thin Film Transistors with Poly(methyl methacrylate) Gate Dielectric ",
    Microelectronics Reliability, Vol. 53, n. 9–11, p. 1798-1803, September–November 2013,
    DOI:10.1016/j.microrel.2013.07.085

  • D. Bari, N. Wrachien, R. Tagliaferro, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester,
    "Comparison between positive and negative constant current stress on dye-sensitized solar cells",
    Microelectronics Reliability, Vol. 53, n. 9–11, p. 1804-1808, September–November 2013,
    DOI:10.1016/j.microrel.2013.07.093

  • D. Bari, A Cester, N. Wrachien, L. Ciammaruchi, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso,
    "Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) ",
    IEEE - Journal of Photovoltaics, Vol. 2, n. 1, p. 27 - 34, Jan. 2012,
    DOI:10.1109/JPHOTOV.2011.2180702

  • N. Wrachien, A. Cester, B. Daniele, J. Kovac, J. Jakabovic, M. Weis, D. Donoval, G. Meneghesso,
    "Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs",
    IEEE - Transaction on Nuclear Science, Vol. 59, n. 6, p. 2979 - 2986, Dec 2012,
    DOI:10.1109/TNS.2012.2222439

  • N. Wrachien, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, G. Meneghesso, A. Cester,
    "Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure",
    Microelectronics Reliability, Vol. 52, n. 9–10, p. 2490-2494, September–October 2012,
    DOI:10.1016/j.microrel.2012.06.055

  • D. Bari, N. Wrachien, R. Tagliaferro, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester
    "Reliability study of dye-sensitized solar cells by means of solar simulator and white LED ",
    Microelectronics Reliability, Vol. 52, n. 9–10, p. 2495–2499, September–October 2012,
    DOI:10.1016/j.microrel.2012.06.061

  • N. Wrachien, A Cester, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, G. Meneghesso,
    "Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors ",
    IEEE Transaction on Electron Devices, Vol. 59, n. 5, p. 1501-1509, May 2012,
    DOI:10.1109/TED.2012.2187338

  • N. Wrachien, A. Cester, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, and G. Meneghesso,
    "Near-UV Irradiation Effects on Pentacene Based Organic Thin Film Transistors",
    IEEE - Transaction on Nuclear Science, Vol. 58, p. 2911 - 2917, Dec. 2011,
    DOI:10.1109/TNS.2011.2170432

  • D. Bari, N. Wrachien, R. Tagliaferro, S. Penna, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester,
    "Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs)",
    Microelectronics Reliability, Vol 51, n. 9-11, p. 1762-1766, September-November 2011,
    DOI:10.1016/j.microrel.2011.07.061

  • A. Cester, D. Bari, J. Framarin, N. Wrachien, G. Meneghesso, S. Xia, V. Adamovich, J.J. Brown,
    "Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED",
    Microelectronics Reliability, Vol. 50, n. 9-11, p. 1866 - 1870, 2010,
    DOI:10.1016/j.microrel.2010.07.114

  • A. Pinato, A. Cester, M. Meneghini, N. Wrachien, A. Tazzoli, S. Xia, V. Adamovich, M. S. Weaver, J.J. Brown, E. Zanoni, G. Meneghesso,
    "Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs",
    IEEE- Transaction on Electron Devices, Vol. 57, n. 1, p. 178 - 187, Jan. 2010,
    DOI:10.1109/TED.2009.2034505

Conferences

  • L. Torto, A. Cester, L. Passarini, A. Rizzo, N. Wrachien, M. Seri, M. Muccini,
    "Open Circuit Voltage Decay as a Tool to Asses the Reliability of Organic Solar Cells: P3HT:PCBM vs. HBG1:PCBM,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. 2F2.1 - 2F2.10, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936272

  • L. Torto, A. Rizzo, A. Cester, N. Wrachien, L. Passarini, F. C. Krebs, M. Corazza, S. A. Gevorgyan
    "Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. 2F4.1 - 2F4.10, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936274

  • A. Rizzo, L. Ortolan, S. Murrone, L. Torto, M. Barbato, N. Wrachien, A. Cester,
    "Effects of Thermal Stress on Hybrid Perovskite Solar Cells with Different Encapsulation Techniques,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. PV-1.1 - PV-1.6, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936396

  • N. Wrachien, L. Torto, N. Lago, A. Rizzo, G. Meneghesso, R. D’Alpaos, G. Generali, G. Turatti, M. Muccini, A. Cester,
    "Thermal Stress Effects on Organic-Thin-Film-Transistors",
    12th International Conference on Organic Electronics (ICOE 2016), p. 79-80, 13-15 June 2016, Bratislava (Slovak Republic),
    DOI:

  • A. Rizzo, A. Cester, L. Torto, M. Barbato, N. Wrachien, N. Lago, M. Corazza, F. C. Krebs, S. A. Gevorgyan,
    "Effects of Current Stress and Thermal Storage on polymeric heterojunction P3HT:PCBM solar cell",
    IEEE International Reliability Physics Symposium (IRPS 2016), p. 3C-2-1 - 3C-2-6, 17-21 Apr 2016, Pasadena (CA), USA,
    DOI:10.1109/IRPS.2016.7574523

  • N. Wrachien, M. Barbato, A. Cester, A. Rizzo, G. Meneghesso, R. D’Alpaos, G. Turatti, G. Generali, M. Muccini,
    "Analysis of ESD Effects on Organic Thin-Film-Transistors by Means of TLP Technique",
    IEEE International Reliability Physics Symposium (IRPS 2016), p. EL-6-1 - EL-6-5, 17-21 Apr 2016, Pasadena (CA), USA,
    DOI:10.1109/IRPS.2016.7574607

  • M. Natali, N. Lago, M. Brucale, S. D. Quiroga, S. Bonetti, E. Benvenuti, E. Bonaretti, N. Wrachien, M. Muccini1, A. Cester, V. Benfenati, S. Toffanin,
    "Investigation on the Mechanism of Bioelectrical Transduction at the Organic/Electrolyte Interface in Perylene-Based O-CST",
    Materials Research Society - Fall Meeting 2015, 29 Nov. - 4 Dec. 2015, Boston,Massachusetts, USA,
    DOI:

  • N. Wrachien, A. Cester, R. D'Alpaos, G. Turatti, M. Muccini, G. Meneghesso,
    "Bias Stress on Complementary Logic Inverters with Organic TFTs",
    Chemistry Materials & Light, p. P-6, 21-23 Sept. 2015, Bologna, Italy

  • A. Cester, N. Wrachien, M. Bon, G. Meneghesso, R. Bertani, R. Tagliaferro, S. Casolucci, T.M. Brown, A. Reale, A. Di Carlo,
    "Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects",
    IEEE International Reliability Physics Symposium (IRPS 2015), p. 3E.2.1 - 3E.2.8, 19-23 Apr 2015, Monterey (CA), USA,
    DOI: 10.1109/IRPS.2015.7112716

  • N. Wrachien, A. Cester, N. Lago, G. Meneghesso, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini,
    "Effects of constant voltage stress on organic complementary logic inverters",
    44th European Solid State Device Research Conference (ESSDERC 2014), p. 298-301, 22-25 Sep 2014, Venezia, Italy,
    DOI:10.1109/ESSDERC.2014.6948819

  • N. Wrachien, A Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, M. Weis, D. Donoval,
    "Effects of Positive and Negative Constant Voltage Stress on Organic TFTs",
    IEEE International Reliability Physics Symposium - IRPS 2013, Monterey, CA, USA, April, 14-18, 2013,
    DOI:10.1109/IRPS.2013.6532123

  • D. Bari, N. Wrachien, G. Meneghesso, A Cester, R. Tagliaferro, T. M. Brown, A. Reale, A. Di Carlo,
    "Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells",
    IEEE International Reliability Physics Symposium - IRPS 2013, Monterey, CA, USA, April, 14-18, 2013,
    DOI:10.1109/IRPS.2013.6532011

  • N. Wrachien, A. Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Organic Thin Film Transistor Degradation Under Sunlight Exposure",
    IEEE - International Reliability Physics Symposium - IRPS 2012, Anaheim, CA, USA April 15-19, 2012,
    DOI:10.1109/IRPS.2012.6241936

  • A. Cester, D. Bari, N. Wrachien, G. Meneghesso,
    "Study of the effect of stress-induced trap levels on OLED characteristics by numerical model",
    IEEE - International Reliability Physics Symposium - IRPS 2012, Anaheim, CA, USA April 15-19, 2012,
    DOI:10.1109/IRPS.2012.6241882

  • D. Bari, A. Cester, N. Wrachien, G. Meneghesso, R. Tagliaferro, T. M. Brown, A. Reale, A. Di Carlo,
    "Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells",
    IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012, Miami, FL, USA, July 16-20, 2012

  • N. Wrachien, A. Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, M. Sokolsky, D. Donoval, J.Cirak,
    "Low-Energy UV Effects on Organic Thin-Film-Transistors",
    Proceedings of IEEE International Reliability Physics Symposium - IRPS 2011, Monterey, CA, USA April 10-14, 2011,
    DOI:10.1109/IRPS.2011.5784462

  • D. Bari, N. Wrachien, A. Cester, G. Meneghesso, R. Tagliaferro, S. Penna, T. M. Brown, A. Reale, A. Di Carlo,
    "Optical Stress and Reliability Study of Ruthenium-based Dye-Sensitized Solar Cells (DSSC)",
    Proceedings of IEEE International Reliability Physics Symposium - IRPS 2011, Monterey, CA, USA April 10-14, 2011,
    DOI:10.1109/IRPS.2011.5784537

  • N. Wrachien, A. Cester, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Effects of soft-UV irradiation on organic thin film transistors with different gate dielectrics",
    8th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM 2010, Smolenice , Slovak Republic, October 25-27, 2010,
    DOI:10.1109/ASDAM.2010.5666327

  • N. Wrachien, A. Cester, N. Bellaio, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, K. Myny, S. Smout, J. Genoe,
    "Light, Bias, and Temperature Effects on Organic TFTs",
    Proceedings of IEEE - International Reliability Physics Symposium - IRPS 2010, Anaheim, California, USA, May 2-6, 2010,
    DOI:10.1109/IRPS.2010.5488806

  • A. Pinato, M. Meneghini, A. Cester, N. Wrachien, A. Tazzoli, E. Zanoni, G. Meneghesso, B. D'Andrade, J. Esler, S. Xia, J.Brown,
    "Improved Reliability of Organic Light-Emitting Diodes with Indium-Zinc-Oxide Anode Contact",
    IEEE - International Reliability Physics Symposium - IRPS 2009, Montreal, Quebec, Canada,April 25-29, 2009,
    DOI:10.1109/IRPS.2009.5173233

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Threshold Voltage Instability in Organic TFT with SiO2 and SiO2/Parylene-Stack Dielectrics,",
    IEEE - International Reliability Physics Symposium - IRPS 2009, Montreal, Quebec, Canada, April 25-29, 2009,
    DOI:10.1109/IRPS.2009.5173234

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso J. Kovac, J. Jakabovic, D. Donoval,
    "Organic TFT with SiO2-Parylene Gate Dielectric Stack and Optimized Pentacene Growth Temperature",
    39th European Solid-State device research Conference, ESSDERC 2009, Athen 14-18 September 2009,
    DOI:10.1109/ESSDERC.2009.5331324

  • J. Kováč, J. Jakabovič, R. Srnánek, J. Kováč jr, D. Donoval, N. Wrachien, A. Cester, G. Meneghesso,
    "Growth morphologies and electrical properties of pentacene organic TFT with SiO2/parylene dielectric layer",
    33rd Workshoop on Compound Semiconductor Devices and integrated Circuits (WOCSDICE2009), Malaga, Spain, May 17-20, 2009

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Charge Trapping in Organic Thin Film Transistors",
    17th European Heterostructure Technology Workshop, HETECH 2008, Venice, Italy, November 2-5, 2008

  • A. Pinato, M. Meneghini, A. Tazzoli, A. Cester, N. Wrachien, E. Zanoni, G. Meneghesso, B. D'Andrade, J. Esler, S. Xia, J.Brown,
    "Indium Zinc Oxide as an alternative to Indium Tin Oxide in OLEDs Technology",
    17th European Heterostructure Technology Workshop, HETECH 2008, Venice, Italy, November 2-5, 2008

MOST - Molecular and Organic Semiconductor Technology
Microelectronic Group - University of Padova