Journals

  • L. Torto, A. Cester, A. Rizzo, N. Wrachien, S. A. Gevorgyan, M. Corazza, F. C. Krebs,
    "Model of organic solar cell photocurrent including the effect of charge accumulation at interfaces and non-uniform carrier generation",
    IEEE Journal of the Electron Devices Society, Vol. 4, n. 6, p. 387-395, 2016,
    DOI:10.1109/JEDS.2016.2602563

  • N. Lago, A. Cester, N. Wrachien, E. Benvenuti, S. D. Quiroga, M. Natali, S. Toffanin, M. Muccini, G. Meneghesso,
    "Investigation of Mobility Transient on Organic Transistor by Means of DLTS Technique",
    IEEE Transactions on Electron Devices, Vol. 63, n. 11, p. 4432-4439, 2015,
    DOI:10.1109/TED.2016.2611142

  • A. Rizzo, L. Torto, N. Wrachien, M. Corazza, F. C. Krebs, S. A. Gevorgyan, A. Cester,
    "Application of Photocurrent Model on Polymer Solar Cells Under Forward Bias Stress",
    IEEE Journal of Photovoltaics, Vol. 6, n. 6, p. 1542-1548, 2016,
    DOI:10.1109/JPHOTOV.2016.2603841

  • A. Rizzo, A. Cester, N. Wrachien, N. Lago, L. Torto, M. Barbato, J. Favaro, S. A. Gevorgyan, M. Corazza, F. C. Krebs,
    "Characterization and modeling of organic (P3HT:PCBM) solar cells as a function of bias and illumination",
    Solar Energy Materials and Solar Cells, Vol. 157, p. 337–345, June 2016,
    DOI: 10.1016/j.solmat.2016.06.001

  • N. Lago, A. Cester, N. Wrachien, M. Natali, S. D. Quiroga, S. Bonetti, M. Barbato, A. Rizzo, E. Benvenuti, V. Benfenati, M. Muccini, S. Toffanin, G. Meneghesso,
    "A physical-based equivalent circuit model for an organic/electrolyte interface",
    Organic Electronics, Vol. 35, p. 176–185, August 2016,
    DOI: 10.1016/j.orgel.2016.05.018

  • N. Lago, A. Cester, N. Wrachien, I. Tomasino, S. Toffanin, S. D. Quiroga, E. Benvenuti, M. Natali, M. Muccini, and G. Meneghesso,
    "On the Pulsed and Transient Characterization of Organic Field-Effect Transistors",
    IEEE - Electron Device Letters, Vol.36 , n.12 , p.1359-1362, Dec. 2015,
    DOI: 10.1109/LED.2015.2496336

  • N. Wrachien, N. Lago, A. Rizzo, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini, G. Meneghesso, A. Cester,
    "Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors with PMMA gate dielectrics",
    Microelectronics Reliability, Vol. 55, n. 9-10, p. 1790-1794, 2015,
    DOI:10.1016/j.microrel.2015.06.073

  • A. Cester, A. Rizzo, A. Bazzega, N. Lago, J. Favaro, M. Barbato, N. Wrachien, S.A. Gevorgyan, M. Corazza, F.C. Krebs,
    "Effects of constant voltage and constant current stress in PCBM: P3HT solar cells",
    Microelectronics Reliability, Vol. 55, n. 9-10, p. 1795-1799, 2015,
    DOI:10.1016/j.microrel.2015.06.082

  • N. Wrachien, A. Cester, N. Lago, A. Rizzo, R. D’Alpaos, A. Stefani, G. Turatti, M. Muccini, G. Meneghesso,
    "Reliability study of organic complementary logic inverters using constant voltage stress",
    Solid-State Electronics, Vol. 113, n. 11, p. 151-156, Nov. 2015,
    DOI:10.1016/j.sse.2015.05.028

  • M. V. Madsen, S. A. Gevorgyan, R. Pacios, J. Ajuria, I. Etxebarria, J. Kettle, N. D. Bristow, M. Neophytou, S. A. Choulis, L. S. Roman, T.Yohannes, A. Cester, et al.,
    "Worldwide outdoor round robin study of organic photovoltaic devices and modules",
    Solar Energy Materials and Solar Cells, Vol. 130, p. 281-290, Nov. 2014,
    DOI:10.1016/j.solmat.2014.07.021

  • N. Wrachien, A. Cester, N. Lago, G. Meneghesso, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini
    "Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states",
    Microelectronics Reliability, Vol. 54, n. 9, p. 1638-1642, Sept. 2014,
    DOI:10.1016/j.microrel.2014.07.065

  • N. Wrachien, A. Cester, D. Bari, R. Capelli, R. D'Alpaos, M. Muccini, A. Stefani, G. Turatti, G. Meneghesso
    "Effects of Constant Voltage Stress on p- and n-type Organic Thin Film Transistors with Poly(methyl methacrylate) Gate Dielectric ",
    Microelectronics Reliability, Vol. 53, n. 9–11, p. 1798-1803, September–November 2013,
    DOI:10.1016/j.microrel.2013.07.085

  • D. Bari, N. Wrachien, R. Tagliaferro, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester,
    "Comparison between positive and negative constant current stress on dye-sensitized solar cells",
    Microelectronics Reliability, Vol. 53, n. 9–11, p. 1804-1808, September–November 2013,
    DOI:10.1016/j.microrel.2013.07.093

  • D. Bari, A Cester, N. Wrachien, L. Ciammaruchi, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso,
    "Reliability Study of Ruthenium-Based Dye-Sensitized Solar Cells (DSCs) ",
    IEEE - Journal of Photovoltaics, Vol. 2, n. 1, p. 27 - 34, Jan. 2012,
    DOI:10.1109/JPHOTOV.2011.2180702

  • N. Wrachien, A. Cester, B. Daniele, J. Kovac, J. Jakabovic, M. Weis, D. Donoval, G. Meneghesso,
    "Improved Tolerance against UV and Alpha Irradiation of Encapsulated Organic TFTs",
    IEEE - Transaction on Nuclear Science, Vol. 59, n. 6, p. 2979 - 2986, Dec 2012,
    DOI:10.1109/TNS.2012.2222439

  • N. Wrachien, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, G. Meneghesso, A. Cester,
    "Enhanced permanent degradation of organic TFT under electrical stress and visible light exposure",
    Microelectronics Reliability, Vol. 52, n. 9–10, p. 2490-2494, September–October 2012,
    DOI:10.1016/j.microrel.2012.06.055

  • D. Bari, N. Wrachien, R. Tagliaferro, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester
    "Reliability study of dye-sensitized solar cells by means of solar simulator and white LED ",
    Microelectronics Reliability, Vol. 52, n. 9–10, p. 2495–2499, September–October 2012,
    DOI:10.1016/j.microrel.2012.06.061

  • N. Wrachien, A Cester, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, G. Meneghesso,
    "Visible Light and Low-Energy UV Effects on Organic Thin-Film Transistors ",
    IEEE Transaction on Electron Devices, Vol. 59, n. 5, p. 1501-1509, May 2012,
    DOI:10.1109/TED.2012.2187338

  • N. Wrachien, A. Cester, D. Bari, J. Kovac, J. Jakabovic, D. Donoval, and G. Meneghesso,
    "Near-UV Irradiation Effects on Pentacene Based Organic Thin Film Transistors",
    IEEE - Transaction on Nuclear Science, Vol. 58, p. 2911 - 2917, Dec. 2011,
    DOI:10.1109/TNS.2011.2170432

  • D. Bari, N. Wrachien, R. Tagliaferro, S. Penna, T.M. Brown, A. Reale, A. Di Carlo, G. Meneghesso, A. Cester,
    "Thermal stress effects on Dye-Sensitized Solar Cells (DSSCs)",
    Microelectronics Reliability, Vol 51, n. 9-11, p. 1762-1766, September-November 2011,
    DOI:10.1016/j.microrel.2011.07.061

  • A. Cester, D. Bari, J. Framarin, N. Wrachien, G. Meneghesso, S. Xia, V. Adamovich, J.J. Brown,
    "Thermal and electrical stress effects of electrical and optical characteristics of Alq3/NPD OLED",
    Microelectronics Reliability, Vol. 50, n. 9-11, p. 1866 - 1870, 2010,
    DOI:10.1016/j.microrel.2010.07.114

  • A. Pinato, A. Cester, M. Meneghini, N. Wrachien, A. Tazzoli, S. Xia, V. Adamovich, M. S. Weaver, J.J. Brown, E. Zanoni, G. Meneghesso,
    "Impact of Trapped Charge and Interface Defects on the Degradation of the Optical and Electrical Characteristics in NPD/Alq3 OLEDs",
    IEEE- Transaction on Electron Devices, Vol. 57, n. 1, p. 178 - 187, Jan. 2010,
    DOI:10.1109/TED.2009.2034505

Conferences

  • L. Torto, A. Cester, L. Passarini, A. Rizzo, N. Wrachien, M. Seri, M. Muccini,
    "Open Circuit Voltage Decay as a Tool to Asses the Reliability of Organic Solar Cells: P3HT:PCBM vs. HBG1:PCBM,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. 2F2.1 - 2F2.10, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936272

  • L. Torto, A. Rizzo, A. Cester, N. Wrachien, L. Passarini, F. C. Krebs, M. Corazza, S. A. Gevorgyan
    "Analysis of electrical and thermal stress effects on PCBM:P3HT solar cells by photocurrent and impedance spectroscopy modeling,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. 2F4.1 - 2F4.10, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936274

  • A. Rizzo, L. Ortolan, S. Murrone, L. Torto, M. Barbato, N. Wrachien, A. Cester,
    "Effects of Thermal Stress on Hybrid Perovskite Solar Cells with Different Encapsulation Techniques,
    IEEE International Reliability Physics Symposium (IRPS 2017), p. PV-1.1 - PV-1.6, 2-6 Apr 2017, Monterey (CA), USA,
    DOI:10.1109/IRPS.2017.7936396

  • N. Wrachien, L. Torto, N. Lago, A. Rizzo, G. Meneghesso, R. D’Alpaos, G. Generali, G. Turatti, M. Muccini, A. Cester,
    "Thermal Stress Effects on Organic-Thin-Film-Transistors",
    12th International Conference on Organic Electronics (ICOE 2016), p. 79-80, 13-15 June 2016, Bratislava (Slovak Republic),
    DOI:

  • A. Rizzo, A. Cester, L. Torto, M. Barbato, N. Wrachien, N. Lago, M. Corazza, F. C. Krebs, S. A. Gevorgyan,
    "Effects of Current Stress and Thermal Storage on polymeric heterojunction P3HT:PCBM solar cell",
    IEEE International Reliability Physics Symposium (IRPS 2016), p. 3C-2-1 - 3C-2-6, 17-21 Apr 2016, Pasadena (CA), USA,
    DOI:10.1109/IRPS.2016.7574523

  • N. Wrachien, M. Barbato, A. Cester, A. Rizzo, G. Meneghesso, R. D’Alpaos, G. Turatti, G. Generali, M. Muccini,
    "Analysis of ESD Effects on Organic Thin-Film-Transistors by Means of TLP Technique",
    IEEE International Reliability Physics Symposium (IRPS 2016), p. EL-6-1 - EL-6-5, 17-21 Apr 2016, Pasadena (CA), USA,
    DOI:10.1109/IRPS.2016.7574607

  • M. Natali, N. Lago, M. Brucale, S. D. Quiroga, S. Bonetti, E. Benvenuti, E. Bonaretti, N. Wrachien, M. Muccini1, A. Cester, V. Benfenati, S. Toffanin,
    "Investigation on the Mechanism of Bioelectrical Transduction at the Organic/Electrolyte Interface in Perylene-Based O-CST",
    Materials Research Society - Fall Meeting 2015, 29 Nov. - 4 Dec. 2015, Boston,Massachusetts, USA,
    DOI:

  • N. Wrachien, A. Cester, R. D'Alpaos, G. Turatti, M. Muccini, G. Meneghesso,
    "Bias Stress on Complementary Logic Inverters with Organic TFTs",
    Chemistry Materials & Light, p. P-6, 21-23 Sept. 2015, Bologna, Italy

  • A. Cester, N. Wrachien, M. Bon, G. Meneghesso, R. Bertani, R. Tagliaferro, S. Casolucci, T.M. Brown, A. Reale, A. Di Carlo,
    "Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects",
    IEEE International Reliability Physics Symposium (IRPS 2015), p. 3E.2.1 - 3E.2.8, 19-23 Apr 2015, Monterey (CA), USA,
    DOI: 10.1109/IRPS.2015.7112716

  • N. Wrachien, A. Cester, N. Lago, G. Meneghesso, R. D'Alpaos, A. Stefani, G. Turatti, M. Muccini,
    "Effects of constant voltage stress on organic complementary logic inverters",
    44th European Solid State Device Research Conference (ESSDERC 2014), p. 298-301, 22-25 Sep 2014, Venezia, Italy,
    DOI:10.1109/ESSDERC.2014.6948819

  • N. Wrachien, A Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, M. Weis, D. Donoval,
    "Effects of Positive and Negative Constant Voltage Stress on Organic TFTs",
    IEEE International Reliability Physics Symposium - IRPS 2013, Monterey, CA, USA, April, 14-18, 2013,
    DOI:10.1109/IRPS.2013.6532123

  • D. Bari, N. Wrachien, G. Meneghesso, A Cester, R. Tagliaferro, T. M. Brown, A. Reale, A. Di Carlo,
    "Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells",
    IEEE International Reliability Physics Symposium - IRPS 2013, Monterey, CA, USA, April, 14-18, 2013,
    DOI:10.1109/IRPS.2013.6532011

  • N. Wrachien, A. Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Organic Thin Film Transistor Degradation Under Sunlight Exposure",
    IEEE - International Reliability Physics Symposium - IRPS 2012, Anaheim, CA, USA April 15-19, 2012,
    DOI:10.1109/IRPS.2012.6241936

  • A. Cester, D. Bari, N. Wrachien, G. Meneghesso,
    "Study of the effect of stress-induced trap levels on OLED characteristics by numerical model",
    IEEE - International Reliability Physics Symposium - IRPS 2012, Anaheim, CA, USA April 15-19, 2012,
    DOI:10.1109/IRPS.2012.6241882

  • D. Bari, A. Cester, N. Wrachien, G. Meneghesso, R. Tagliaferro, T. M. Brown, A. Reale, A. Di Carlo,
    "Study of the Effects of UV-Exposure on Dye-Sensitized Solar Cells",
    IEEE Nuclear and Space Radiation Effects Conference - NSREC 2012, Miami, FL, USA, July 16-20, 2012

  • N. Wrachien, A. Cester, D. Bari, G. Meneghesso, J. Kovac, J. Jakabovic, M. Sokolsky, D. Donoval, J.Cirak,
    "Low-Energy UV Effects on Organic Thin-Film-Transistors",
    Proceedings of IEEE International Reliability Physics Symposium - IRPS 2011, Monterey, CA, USA April 10-14, 2011,
    DOI:10.1109/IRPS.2011.5784462

  • D. Bari, N. Wrachien, A. Cester, G. Meneghesso, R. Tagliaferro, S. Penna, T. M. Brown, A. Reale, A. Di Carlo,
    "Optical Stress and Reliability Study of Ruthenium-based Dye-Sensitized Solar Cells (DSSC)",
    Proceedings of IEEE International Reliability Physics Symposium - IRPS 2011, Monterey, CA, USA April 10-14, 2011,
    DOI:10.1109/IRPS.2011.5784537

  • N. Wrachien, A. Cester, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Effects of soft-UV irradiation on organic thin film transistors with different gate dielectrics",
    8th International Conference on Advanced Semiconductor Devices and Microsystems - ASDAM 2010, Smolenice , Slovak Republic, October 25-27, 2010,
    DOI:10.1109/ASDAM.2010.5666327

  • N. Wrachien, A. Cester, N. Bellaio, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, K. Myny, S. Smout, J. Genoe,
    "Light, Bias, and Temperature Effects on Organic TFTs",
    Proceedings of IEEE - International Reliability Physics Symposium - IRPS 2010, Anaheim, California, USA, May 2-6, 2010,
    DOI:10.1109/IRPS.2010.5488806

  • A. Pinato, M. Meneghini, A. Cester, N. Wrachien, A. Tazzoli, E. Zanoni, G. Meneghesso, B. D'Andrade, J. Esler, S. Xia, J.Brown,
    "Improved Reliability of Organic Light-Emitting Diodes with Indium-Zinc-Oxide Anode Contact",
    IEEE - International Reliability Physics Symposium - IRPS 2009, Montreal, Quebec, Canada,April 25-29, 2009,
    DOI:10.1109/IRPS.2009.5173233

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Threshold Voltage Instability in Organic TFT with SiO2 and SiO2/Parylene-Stack Dielectrics,",
    IEEE - International Reliability Physics Symposium - IRPS 2009, Montreal, Quebec, Canada, April 25-29, 2009,
    DOI:10.1109/IRPS.2009.5173234

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso J. Kovac, J. Jakabovic, D. Donoval,
    "Organic TFT with SiO2-Parylene Gate Dielectric Stack and Optimized Pentacene Growth Temperature",
    39th European Solid-State device research Conference, ESSDERC 2009, Athen 14-18 September 2009,
    DOI:10.1109/ESSDERC.2009.5331324

  • J. Kováč, J. Jakabovič, R. Srnánek, J. Kováč jr, D. Donoval, N. Wrachien, A. Cester, G. Meneghesso,
    "Growth morphologies and electrical properties of pentacene organic TFT with SiO2/parylene dielectric layer",
    33rd Workshoop on Compound Semiconductor Devices and integrated Circuits (WOCSDICE2009), Malaga, Spain, May 17-20, 2009

  • N. Wrachien, A. Cester, A. Pinato, M. Meneghini, A. Tazzoli, G. Meneghesso, J. Kovac, J. Jakabovic, D. Donoval,
    "Charge Trapping in Organic Thin Film Transistors",
    17th European Heterostructure Technology Workshop, HETECH 2008, Venice, Italy, November 2-5, 2008

  • A. Pinato, M. Meneghini, A. Tazzoli, A. Cester, N. Wrachien, E. Zanoni, G. Meneghesso, B. D'Andrade, J. Esler, S. Xia, J.Brown,
    "Indium Zinc Oxide as an alternative to Indium Tin Oxide in OLEDs Technology",
    17th European Heterostructure Technology Workshop, HETECH 2008, Venice, Italy, November 2-5, 2008

MOST - Molecular and Organic Semiconductor Technology
Microelectronic Group - University of Padova